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NIST Technicalendar
October 26 to October 30, 2009 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal. |
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10:30 AM -TUESDAY - 10/27
11:00 AM - Future Challenges for the Industry of Organic PhotovoltaicsWEDNESDAY - 10/28
2:00 PM - Model-based white light interference microscopy for metrology of transparent film stacks and optically-unresolved structures
12:00 PM - In-Situ Analytical Electron Microscopy: Integrated Platform for Characterization, Testing and Processing of Materials in the 21st CenturyTHURSDAY - 10/29
2:00 PM - Making Workplace Accommodations with the help of JAN
1:30 PM - MAGNETOELECTRIC EFFECT IN MULTIFERROIC OXIDES: A PEDAGOGICAL OVERVIEWFRIDAY - 10/30
10:30 AM - "An Overview of Health Sciences Authority and the Chemical Metrology Programme"
10:30 AM - Micromechanical Principles in Sintering And It's Verification By Using MEMS-Inspired Experimental Method
10:30 AM - Innovations in Semiconductor Devices for Exascale Computing
2:00 PM - CNST Nanofabrication Research Group Seminar
Special Assistance Available
Special Assistance Available