|
NIST Quick Technicalendar
October 26 to October 30, 2009 The NIST Technicalendar is issued each Friday. All items MUST be submitted electronically from this web page by 12:00 NOON each Wednesday unless otherwise stated in the NIST Technicalendar. The address for online weekly editions of the NIST Technicalendar and NIST Administrative Calendar is: http://www.nist.gov/tcal. |
Please evaluate the web Technicalendar using our 30 Second Evaluation 
| |
| This Issue only All Issues |
10:30 AM -TUESDAY - 10/27
11:00 AM - Future Challenges for the Industry of Organic PhotovoltaicsWEDNESDAY - 10/28
2:00 PM - Model-based white light interference microscopy for metrology of transparent film stacks and optically-unresolved structures
12:00 PM - In-Situ Analytical Electron Microscopy: Integrated Platform for Characterization, Testing and Processing of Materials in the 21st CenturyTHURSDAY - 10/29
2:00 PM - Making Workplace Accommodations with the help of JAN
1:30 PM - MAGNETOELECTRIC EFFECT IN MULTIFERROIC OXIDES: A PEDAGOGICAL OVERVIEWFRIDAY - 10/30
10:30 AM - "An Overview of Health Sciences Authority and the Chemical Metrology Programme"
10:30 AM - Micromechanical Principles in Sintering And It's Verification By Using MEMS-Inspired Experimental Method
10:30 AM - Innovations in Semiconductor Devices for Exascale Computing
2:00 PM - CNST Nanofabrication Research Group Seminar
11/5/09 9:00 AM - Counterintelligence; Indicators of Espionage 2009-2010
11:00 AM - CARNEGIE INSTITUTION OF WASHINGTON/GEOPHYSICAL LAB. SEMINAR: Mineral Surface Controls on Early Cell Membrane EvolutionTUESDAY - 10/27
WEDNESDAY - 10/28
No Scheduled EventsTHURSDAY - 10/29
No Scheduled EventsFRIDAY - 10/30
No Scheduled Events
No Scheduled Events
10/21 - Progress on Radiative Transition Probabilities in Neutral Cerium
10/26 - Materials Analysis At or Near Atomic Resolution
10/26 - Characterization of Thin Film CuCr2Se4 By A Modulated Elemental Reactant
10/26 - Over the rainbow: extreme adventures in the ultraviolet
10/27 - Artificial Intelligence Tools for Failure Event Database Management and Probability Risk Analysis for Failure Prevention
10/27 - Analyzing Complex Microstructures with OOF
10/27 - Recent Metrology Research of Thermoelectric Materials at NIST
10/27 - Using Confidence Ellipsoids to Choose the Regularization Parameter for Ill-Posed Problems
10/27 - Thermalization Near Integrability in the 1D Bose-Hubbard Model
10/28 - Fast Iterative Solver for Incompressible Navier-Stokes Equations with Spectral Elements
10/28 - Phase Relation Studies of Materials for Coated Conductor and Waste Heat Recovery Applications
10/28 - An Electron Microscopy Study of Fine and Coarse Ambient Air Particles Collected at Different Times of the Year from Three Major Geographically-Distinct Urban Areas.
10/28 - Investigating the Structure and Composition of Urban Ambient-Air Particles Using Focused Ion-Beam Scanning Electron Microscopy.
10/29 - OOF: An Image-Based Finite Element Solver for Materials Science
10/30 - Structure Measurements for Organic Photovoltaics
11/11 - Predicting Excitation Spectra in Solids: A Practical Bethe-Salpeter Approach
Diversity Day 4: Generational Diversity
No Web Site announcements this week.